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Expertises and services 

Axis 1: Characterization of materials

 

Superconductors

(S)

Conductors

(C)

Magnetic materials

(M)

Resistive materials

(R)

Insulating materials

(I)

Films

(tick and thin)

 (F)

-REBCO films on substrate

(coated conductors)

-Metallic conductive coatings (Cu, Ag, Zn, Ni, Cd, etc.)

 

-Resistive barriers (oxides in thin films <100 nm)

-Insulating barriers (oxides in thin films >100 nm)

Laminated materials

(L)

 

-Hastelloy laminates (substrates for superconducting wires)

-Silicon steel laminations (for transformers and electric machines)

-Carbon fiber composites

 

Bulk materials

(B)

-REBCO bulks

-REBCO tubes

-Conventional metals and alloys (Cu, Al, etc.)

-Magnetic steels and superalloys

-Permanent magnets (all types)

-Power semi-conductors

-Fiber glass composites

 

Experimental characterization of material properties

Electrical properties

-V-I curves, critical current measurement (Ic), NZPV, MQE: multi-probe measurements

-Resistivity/Electrical Resistance/Hall effect: multi-probe measurements

-Contact resistance: different methods depending on the material considered

-Current transfer length, surface potential: electrode matrices, multi-probe measurements

 

Magnetic properties

-B-H curves: home-made hysteresis meter (20-900 °C), VSM

-Iron losses: custom setups

-Magnetization of permanent magnets: custom giant magnetometer

-Electron paramagnetic resonance spectrometer: cavities available at 9, 17, 24, 31 and 38 GHz

 

Mechanical and structural properties

-Thickness of thin layers, surface roughness: profilometer

-Structure of matter: wide variety of microscopes

-Hardness: Vickers hardness test

-Thermal contraction: custom setups

 

Range of experimental parameters*

-Temperature:              10 to 300 K (in vacuum), 64 to 90 K (in liquid nitrogen)

                                      300 to 900 K (in a low pressure Argon atmosphere)

-Magnetic field:            0 tp 5 T (in vacuum or in cryogenic liquid)

-Current:                       DC: 0-500 A  –  Pulsed: 0-1800 A (<10 ms) or 0-1600 A (5-500 ms)

-Measurable voltage:   100 nV to 250 V, up to 80 simultaneous readings

*Depending on the type of sample and its size, the experimental conditions may be restricted.

 

Axis 2: Physical modeling

Modeling of the electromagnetic and thermal behavior of various devices

-Short-circuit current limiters / Hot-spot propagation phenomena

-Magnetic levitation systems

-Power transmission cables

-Motors/Generators, etc.

-Electrical network

 

Algorithms for numerical simulation of electromagnetic and thermal problems

-Finite element method: home-made and commercial codes

-Integral methods: home-made and commercial codes

 

Materials modeling

-Mathematical models of materials from measurements

-Superconducting materials

-Magnetic materials (including hysteresis) and permanent magnets

-Thin films and resistive barriers

-Integration of material models in numerical simulation software programs

-Algorithms to improve the convergence of nonlinear materials in numerical simulation software programs

 

Axis 3: Design of devices

Design assisted by numerical simulation 

-Proof of concept by computer

-Parameterization and automation of numerical simulations

-Optimization of dimensions

-Performance prediction

 

Manufacturing techniques

-Surface plating: electroplating, sputtering, chemical methods (electroless)

-Additive manufacturing: cold spray, laser powder bed fusion

-Etching of surfaces: electro-polishing, masking + chemical attack

-Oxidation of surfaces: chemical attack + anodization

-Oxygenation of superconductors: oven with gas flow or pressure (up to 700 °C)

-Soldering: regular, with special alloys, of Litz wires, at low temperature

-Low temperature materials: cryostats, custom fixtures and sample holders, etc.

-Reel-to-reel processing enables continuous treatment of long-length tapes

-Cabling machine for superconducting cable fabrication

 

Axis 4: Testing and instrumentation

Data acquisition equipment

-Acquisition cards: many types, from very slow to very fast (up to 500 MS/s)

-Oscilloscopes and other conventional measuring instruments

 

Custom electronic circuit design

-Pulsed current sources: several types (5-1000 ms, 1-100 ms, DC)

-Voltage measurement systems: 16/40/80 differential inputs (1 mV to 250 V)

-Automated signal multiplexers: synchronized scanning of input signals

-Interconnection and signal conditioning boxes: custom designs

 

Specialized measurement test benches

-Zone normal propagation velocity (NZPV) and minimum quench energy (MQE) in superconducting tapes

-Quench of superconducting tapes in short-circuit conditions

-Critical temperature of superconductors

-3-D mapping of magnetic field around magnetized bodies (such as permanent magnets)

-Oxygen/hydrogen desorption measurements by differential pressure

 

Specialized instrumentation for power tests

-2 test areas: three-phase AC: 600 V/400 A/400 kVA, DC: 500 V/200 A/50 kW

-Power amplifiers: 2 x 5 kW/50 A/100V/50 kHz, 6 x 50 kW/200 A/250V/1 KHz

-Lightning current generator: 10-50 kA, 5 ms of rise time

-Real-time simulators: OPAL-RT, Hypersim (for prototyping of controllers)

-Conventional measuring equipment: power analyzers, current transformers, etc.

 

Magnetic sensors

-Hall effect, Fluxgate, Giant Magnetoimpedance (GMI), ODMR

 

Other specialized infrastructure

-DC and pulsed Electromagnets (up to 7 T, several models)

-Cryostats for low temperature tests (10 to 300 K, several types)

-Ovens for heat treatments or aging tests in air or controlled atmosphere (in vacuum of oxygen up to 900 °C)

-Custom fixtures and sample holders (for operation between 10 and 1000 K)

Example: NZPV measurements

Pulsed current source, up to 2000 A, with durations from ms to hundreds of ms
Temperature range from 65 K to 77 K
Spatial resolution down to 1 mm along meter-scale samples

Interested in characterizing the NZPV of your superconducting tape or cable? Please contact us so we can help you designing safe and resilient superconducting devices.